Electrostatic discharges

Targets

Electrostatic Discharges (ESD) from people and objects can disrupt or destroy electronic systems. Semiconductor components in particular are sensitive to ESD. Special test methods can be used to simulate the anticipated ESD stresses in practice.

In order to estimate the ESD immunity of electronic systems in early development phases, powerful and accurate simulation models of the entire test chain are necessary. Research topics here are:

Individualized models for ESD test equipment
Simulation of pulse propagation on circuit boards and line structures
Models and methods for line discharges
Models for external protection structures (diodes, varistors, polymers, ...)
Modeling of high current and failure behavior of complex ICs
Transient fields of ESD

Plot eines Vergleichs zwischen ESD Simulation und ESD Messung

Methods

ESD generator modeling

The discharge from a human is usually modeled for testing with ESD generators according to IEC 61000-4-2 or ISO 10605. Studies have shown that test results can be significantly generator dependent. This is due to small design differences that are within the tolerances specified by the standards. Individual models of test generators are thus gaining in importance. Within the research activities at the research area on-board systems, modeling techniques based on special measurement methods for test equipment are investigated.

Modeling of the ESD strength of semiconductors

The behavior of semiconductor structures during ESD events can be characterized with the Transmission Line Pulser (TLP). Based on the measurement data, the behavior for static and dynamic behavior of individual ICs can be accurately modeled up to the high current behavior. In current research activities at the AG Onboard Systems, the modeling of the failure behavior during ESD events is being further investigated.